Students: Computer Vision in Semiconductor Metrology

Overview

The Fraunhofer Institute for Electronic Nano Systems ENAS develops smart systems that combine electronic components, micro‑ and nano‑sensors and actuators with communication interfaces. The Data‑based Methods team develops real‑world applications using AI, machine learning, and computer vision, with a main focus on semiconductor manufacturing and medical technology.

We are looking for students for master’s theses, internships, and student assistants.

Key Responsibilities

• Development of computer vision models to analyze measurement data.
• Extract meaningful information from metrological data.
• Deploy your pipeline in web‑based user interfaces.

Qualifications

• Strong understanding and practical experience with image processing methods or computer vision models.
• Excellent programming skills, preferably in Python.
• Strong abstract and mathematical thinking skills.
• Strong interest in interdisciplinary work at the interface of software engineering, data science, and semiconductor metrology.
• Currently studying in Chemnitz, Mittweida, or the surrounding area.

We value and promote the diversity of our employees’ skills and therefore welcome all applications – regardless of age, gender, nationality, ethnic and social origin, religion, ideology, disability, sexual orientation and identity. Severely disabled persons are given preference in the event of equal suitability. Our tasks are diverse and adaptable – for applicants with disabilities, we work together to find solutions that best promote their abilities.

Requisition Number: 73238
Application Deadline: