CDSEM Expert (f/m/d)

Stellenbeschreibung:

Overview

In this role you will operate, optimize and maintain CD-SEM metrology to deliver nanoscale wafer measurements. You will translate measurement data into actionable insights to support process control, yield improvement and advanced node development. You’ll collaborate with lithography, etch and metrology teams to ensure stable, high-performing processes and you’ll help build metrology capability through training and documentation. This is a hands-on, cross-functional position at the intersection of measurement science and semiconductor manufacturing, offering opportunities to shape metrology methods and drive product-grade quality in a cutting-edge environment.

Leistungen / Benefits

comprehensive benefits package
outstanding insurance
pension
virtual stock options
growth opportunities
focus on work-life harmony

Verantwortungsbereiche

Operate CD-SEM tools for critical dimension, profile and defect measurements
Ensure accuracy, repeatability and reproducibility of CD measurements for process control and yield improvement
Perform preventive maintenance, troubleshooting and root cause analysis for tool stability and uptime
Collaborate with vendors for repairs and spare parts
Correlate CD-SEM data with process performance with cross-functional teams
Generate reports and dashboards on metrology metrics (CD bias, LWR, LER) to support monitoring
Support metrology capability building via training and documentation
Drive improvements in metrology methods and ensure compliance with EHS guidelines

Zentrale Anforderungen

5+ years in semiconductor manufacturing environments
Hands-on experience with CD-SEM tools (Hitachi, Applied Materials) in a fab
Experience with data analysis tools (JMP, Python, MATLAB) and strong analytical skills
Ability to work in cleanroom environments under tight deadlines
Strong teamwork and cross-functional collaboration and willingness to train others
Understanding of photolithography and etch processes (preferred)